Keywords : Film Thickness
journal of kerbala university,
2012, Volume 8, Issue 3, Pages 59-67
A compound (CuZnSnO4) as thin films is deposited by thermal evaporation method at room temperature onto glass substrates at film thicknesses (100 & 300) nm. The structure of CuZnSnO4films is amorphous as indicated by X-ray diffraction pattern. Optical parameters like, transmittance, energy gap, constants of direct transition, Urbach energy, refractive index, extinction coefficient, and complex dielectric constant are studied. A good property for this compound, it can be used as window layer or absorbance layer with the variation of film thickness.