ISSN: 1813-0410

Keywords : Lot Tolerance Percentage Defective

Constructing a single sampling plan to inspection product for complete and truncated inspection time with application

journal of kerbala university, Volume 10, Issue 0, Pages 268-276

This paper deals with constructing sampling inspection plan, according to the Lot Tolerance Percentage Defective (LTPD). The design of sampling plan has been done in two cases, the first one, doesn't taken the distribution of time to failure into consideration, while the second method depend on the distribution of time to failure which is found to be generalized exponential with two parameters (GE[λ,δ]), where (λ) is scale parameter, (δ) is shape parameter. Tables for designing samples are constructed, also table for probability of acceptance also was formed, the application have been done and using simulation procedure. The comparison has been done through mean square error (MSE) .