Keywords : Cu concentration
journal of kerbala university,
Volume 10, Issue 4, Pages 175-184
CdS and copper doped Cd1-xSCux thin films have been prepared by the spray pyrolysis method. The optical band gaps of pure and doped CdS were found to be varied from 2.34 to 2.45 eV with increase x from 0 to 0.1. The X-ray diffraction (XRD) analysis revealed that the films were polycrystalline and exhibited two phases cubic and hexagonal structure with increasing the hexagonal phase with increasing Cu ratio.