Author : Fawzi Najm AL-Shammari, Ali
journal of kerbala university,
Volume 6, Issue 2, Pages 144-154
IC (Integrated Circuit) is important part of electronic circuits, as it has a low cost, small size, high speed, and many other good features. In general, IC’s are classified into analogue IC’s and digital IC’s, the word digital refer that the device can read and write digital signal only which consists of tow levels (logic 0 and logic 1).
This paper discusses the design and implementation of digital IC tester interfaced to IBM compatible computer which enable fast and reliable digital IC testing. Proposed digital IC tester interfaced to computer via parallel port. Device designed to test and analyzes Digital IC behavior in order to verify if it works properly or not.
At many cases, digital IC’s must be tested in order to know the damage location in large and complex electronic circuits,
The software that drives the device programmed in visual C++ which enables fast data transmission through parallel port and gives the user the flexibility to test different kind of digital IC’s and adds their data sheets to program data base in order to increase software capability.